Approximation of crystallite size and microstrain via XRD line broadening analysis in TiSiN thin films

HASSAN, MASJUKI BIN HAJI (2012) Approximation of crystallite size and microstrain via XRD line broadening analysis in TiSiN thin films. Vacuum, 86.

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: Approximation of crystallite size and microstrain via XRD line broadening analysis in TiSiN thin fil
Subjects: University Structure > Faculty of Engineering, Science and Mathematics > School of Engineering Sciences
Depositing User: MR. ADNAN YAHYA
Date Deposited: 27 Feb 2015
Last Modified: 27 Feb 2015
URI: http://repository.um.edu.my/id/eprint/97927

Actions (login required)

View Item View Item