Items where Author is "F., Hatta, S. F., Soin, N., Hadi, D. A., & Zhang, J."

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F., Hatta, S. F., Soin, N., Hadi, D. A., & Zhang, J. (2010) NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. Microelectronic Reliability, 50 (9-11). 12831289.

This list was generated on Fri Nov 24 01:36:24 2017 MYT.