Items where Author is "Hadi, D. Abd."

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Article

Hadi, D. Abd. (2010) Laser anneal induced effects on the NBTI degradation of advanced process 45nm high-k pMOS. pp. 1862-1866.

Hadi, D. Abd. and J.F.Zhang, J.F.Zhang and Soin, N. and Hatta, S.F.Wan Muhamad (2010) NBTI degradation effect on advanced-process 45nm high- k PMOSFETs with geometric and process variations. Microelectronic Reliability.

This list was generated on Sat Sep 23 01:53:18 2017 MYT.