Items where Author is "Hadi, D. Abd."

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 2.


Hadi, D. Abd. (2010) Laser anneal induced effects on the NBTI degradation of advanced process 45nm high-k pMOS. pp. 1862-1866.

Hadi, D. Abd. and J.F.Zhang, J.F.Zhang and Soin, N. and Hatta, S.F.Wan Muhamad (2010) NBTI degradation effect on advanced-process 45nm high- k PMOSFETs with geometric and process variations. Microelectronic Reliability.

This list was generated on Mon May 21 01:53:38 2018 MYT.