Items where Author is "J.F.Zhang, J.F.Zhang"

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Number of items: 3.

Article

Hadi, D. Abd. and J.F.Zhang, J.F.Zhang and Soin, N. and Hatta, S.F.Wan Muhamad (2010) NBTI degradation effect on advanced-process 45nm high- k PMOSFETs with geometric and process variations. Microelectronic Reliability.

Other

J.F.Zhang, J.F.Zhang and N.Soin, N.Soin and Hatt, S.F.Wan Muhamad (2010) The Effect of Gate Oxide Thickness and Drain Bias on NBTI Degradation in 45nm PMOS. IEEE.

J.F.Zhang, J.F.Zhang and Soin, N. and Hatta, S.F.Wan Muhamad (2010) The Effect of Process Variation on NBTI Degradation in 90nm PMOS. IEEE.

This list was generated on Sun Sep 24 02:11:53 2017 MYT.