Items where Author is "Wahab, H. Hussin, N. Soin, M. F. Bukhori, S. Wan Muhamad Hatta, and"

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Wahab, H. Hussin, N. Soin, M. F. Bukhori, S. Wan Muhamad Hatta, and (2014) Effects of Gate Stack Structural and Process Defectivity on High- Dielectric Dependence of NBTI Reliability in 32 nm Technology Node PMOSFETs. The Scientific World Journal, 2014.

This list was generated on Tue Sep 26 01:45:16 2017 MYT.